Published September 1992 | Version v1
Journal article Metadata-only

A test system for TOF electronics

Creators

  • 1. Academia Sinica, Beijing, BJ (China). Inst. of High Energy Physics

Description

A system is described which is used in the test of Beijing Spectrometer (BES) TOF readout electronics. The hardware can provide the various inputs required, and with the support of the related software, the system can do various measurements required with good resolution and flexibility. It is quite useful in the run and maintenance of the BES

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
12
Journal Issue
suppl.
Series
Proceedings of 6th national coference on nuclear electronics and nuclear detection technology (A).
Journal Page Range
p. 28-32.
ISSN
0258-0934
CODEN
HDYUEC

Conference

Title
6. national conference on nuclear electronics and nuclear detection technology.
Dates
21-26 Sep 1992.
Place
Weihai (China).

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
26011624
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEIJING ELECTRON-POSITRON COLLIDER; ELECTRONIC CIRCUITS; LABORATORY EQUIPMENT; OSCILLOGRAPHS; PARTICLE IDENTIFICATION; PROGRAMMING; READOUT SYSTEMS; RESOLUTION; TIME-OF-FLIGHT SPECTROMETERS
Descriptors DEC
ACCELERATORS; ELECTRONIC EQUIPMENT; EQUIPMENT; LINEAR ACCELERATORS; MEASURING INSTRUMENTS; SPECTROMETERS; STORAGE RINGS