Structural sensitivity of electrical resistance of amorphous crystalline thin films of CrSi2 under conditions of the external size effect

The total electrical resistivity of a thin amorphous-crystalline film is presented by three terms: resistivity of a two-dimensional and two-phase composite, resistivity due to the external size effect, and resistivity due to a decrease in the concentration of electrons with crystallite growth. The composite resistivity is obtained by solving the Odelevsky equation. the experimental results have shown that both the concentration of crystallites and microstructure morphology can greatly enhance the resistivity of amorphous-crystalline films