Published May 2007 | Version v1
Journal article

Estimation of microstructural properties from synchrotron X-ray microtomography and determination of the REV in paper materials

  • 1. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, Polygone Scientifique, BP220, 38043 Grenoble (France)
  • 2. Laboratoire de Genie des Procedes Papetiers (LGP2), Ecole Francaise de Papeterie de Grenoble, Institut National Polytechnique de Grenoble, 38000 Grenoble Cedex (France)
  • 3. Laboratoire Sols-Solides-Structures (3S), CNRS, Universites de Grenoble (INPG-UJF), BP53, 38041 Grenoble Cedex (France)

Description

The porosity and specific surface areas of four industrial paper materials were determined from synchrotron X-ray microtomography. The porosity profile within the thickness of each paper material shows that a paper sheet consists of three layers: two boundary layers, which present a strong gradient of porosity, and a 'bulk' layer in which the porosity is almost constant. The anisotropy and the heterogeneity scale of the microstructure in the 'bulk' layer was then analyzed by means of covariograms. It is shown that the microstructure of the four studied papers is transverse isotropic and that the anisotropy of papers containing fillers is less pronounced. Finally, the representative elementary volume (REV) for both studied microstructural properties was evaluated using two techniques: a systematic analysis of the influence of the volume size on the property measurement, and a statistical methodology. The REVs given by both methodologies are then compared

Additional details

Identifiers

DOI
10.1016/j.actamat.2006.11.050;
PII
S1359-6454(07)00040-7;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
55
Journal Issue
8
Journal Page Range
p. 2841-2850
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39034768
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANISOTROPY; BOUNDARY LAYERS; IMAGE PROCESSING; MICROSTRUCTURE; POROSITY; POROUS MATERIALS; SPECIFIC SURFACE AREA; SYNCHROTRON RADIATION; TOMOGRAPHY; X RADIATION
Descriptors DEC
BREMSSTRAHLUNG; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LAYERS; MATERIALS; PHYSICAL PROPERTIES; PROCESSING; RADIATIONS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.