Estimation of microstructural properties from synchrotron X-ray microtomography and determination of the REV in paper materials
- 1. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, Polygone Scientifique, BP220, 38043 Grenoble (France)
- 2. Laboratoire de Genie des Procedes Papetiers (LGP2), Ecole Francaise de Papeterie de Grenoble, Institut National Polytechnique de Grenoble, 38000 Grenoble Cedex (France)
- 3. Laboratoire Sols-Solides-Structures (3S), CNRS, Universites de Grenoble (INPG-UJF), BP53, 38041 Grenoble Cedex (France)
Description
The porosity and specific surface areas of four industrial paper materials were determined from synchrotron X-ray microtomography. The porosity profile within the thickness of each paper material shows that a paper sheet consists of three layers: two boundary layers, which present a strong gradient of porosity, and a 'bulk' layer in which the porosity is almost constant. The anisotropy and the heterogeneity scale of the microstructure in the 'bulk' layer was then analyzed by means of covariograms. It is shown that the microstructure of the four studied papers is transverse isotropic and that the anisotropy of papers containing fillers is less pronounced. Finally, the representative elementary volume (REV) for both studied microstructural properties was evaluated using two techniques: a systematic analysis of the influence of the volume size on the property measurement, and a statistical methodology. The REVs given by both methodologies are then compared
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2006.11.050;
- PII
- S1359-6454(07)00040-7;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 55
- Journal Issue
- 8
- Journal Page Range
- p. 2841-2850
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39034768
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; BOUNDARY LAYERS; IMAGE PROCESSING; MICROSTRUCTURE; POROSITY; POROUS MATERIALS; SPECIFIC SURFACE AREA; SYNCHROTRON RADIATION; TOMOGRAPHY; X RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LAYERS; MATERIALS; PHYSICAL PROPERTIES; PROCESSING; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.