Published May 1, 2018 | Version v1
Journal article

Correction of phase-shifting error in wavelength scanning digital holographic microscopy

  • 1. Shanghai Engineering Research Center for Ultra-Precision Optical Manufacturing, Fudan University, Shanghai 200438 (China)

Description

Digital holographic microscopy is a promising method for measuring complex micro-structures with high slopes. A quasi-common path interferometric apparatus is adopted to overcome environmental disturbances, and an acousto-optic tunable filter is used to obtain multi-wavelength holograms. However, the phase shifting error caused by the acousto-optic tunable filter reduces the measurement accuracy and, in turn, the reconstructed topographies are erroneous. In this paper, an accurate reconstruction approach is proposed. It corrects the phase-shifting errors by minimizing the difference between the ideal interferograms and the recorded ones. The restriction on the step number and uniformity of the phase shifting is relaxed in the interferometry, and the measurement accuracy for complex surfaces can also be improved. The universality and superiority of the proposed method are demonstrated by practical experiments and comparison to other measurement methods. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/aaa8c1

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
29
Journal Issue
5
Journal Page Range
[9 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51046674
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; CORRECTIONS; ERRORS; HOLOGRAPHY; INTERFEROMETRY; MICROSCOPY; PHASE SHIFT; WAVELENGTHS
Descriptors DEC
EVALUATION