An X-ray filter assembly for fluorescence EXAFS measurements

Fluorescence detection, in principle, permits the detection of the extended X-ray absorption fine structure (EXAFS) of more dilute atoms than can be obtained in absorption. To take advantage of this it is necessary, in practice, to eliminate the background that normally accompanies the fluorescence signal. We describe an X-ray filter assembly that acomplishes this purpose. The unique characteristic of the assembly is a slit system that minimizes the fluorescence background from the filter. The theory of the slit assembly is presented and is found to agree with measurements made on the Fe EXAFS of a dilute sample. The filter assembly has a better effective counting rate in this case than that of a crystal monochromator design. (orig.)