Published October 25, 2004 | Version v1
Journal article

Aging effects on fracture behavior of 63Sn37Pb eutectic solder during tensile tests under the SEM

  • 1. State Key Laboratory of Advanced Welding Production Technology, Harbin Institute of Technology 92, Xidazhi Street, Nangang, Harbin, 150001 (China)
  • 2. Shenzhen Graduate School of Harbin Institute of Technology, Xili Shenzhen University Town, Shenzhen, 518055 (China)
  • 3. Department of Naval Architecture and Ocean Engineering, Chosun University 375, Seosek Dong, Donggu, Guangju 501-759 (Korea, Republic of)

Description

This study investigates the influence of aging treatment on fracture behavior of Sn-Pb eutectic solder alloys at different loading rate regime during tensile tests under the scanning electron microscope. In high homologous temperature, the solder exhibit the creep behavior that could be confirmed through the phenomena of grain boundary sliding (GBS) to both as-cast and aged specimens. Owing to the large grain scale after high temperature storage, boundary behavior was limited to some extent for the difficulty in grain rotation and boundary migration. Instead, drastic intragranular deformation occurred. Also, the phase coarsening weakened the combination between lead-rich phase and tin matrix. Consequently, surface fragmentation was detected for the aged specimens. Furthermore, the fracture mechanism changed from intergranular dominated to transgranular dominated with increasing loading rate to both specimens during early stage

Additional details

Identifiers

DOI
10.1016/j.msea.2004.06.030;
PII
S0921-5093(04)00856-1;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
384
Journal Issue
1-2
Journal Page Range
p. 314-323
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38053995
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AGING; ALLOYS; CREEP; DEFORMATION; EUTECTICS; FRACTURES; GRAIN BOUNDARIES; LEAD; LOADING RATE; MIGRATION; ROTATION; SCANNING ELECTRON MICROSCOPY; SURFACES; TEMPERATURE RANGE 0400-1000 K; TIN
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; FAILURES; MECHANICAL PROPERTIES; METALS; MICROSCOPY; MICROSTRUCTURE; MOTION; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.