Compton scattering of high-energy electrons from helium

The electron-impact energy-loss spectrum of He at a scattering angle of 7° has been measured with an energy resolution of 2.7 eV full width at half-maximum using 25-keV incident electrons. A binary-encounter approximation was used to obtain the electron Compton profile from the cross-section differential with respect to both the energy loss of the incident electron and solid angle of the scattered electron $\frac{d^2\sigma }{dEd\Omega }$. The electron Compton profile was corrected for interference scattering from pairs of target electrons and exchange. It was then compared to theoretical and x-ray experimental values for the Compton profile. The effects of background, multiple scattering, and energy resolution are discussed. The electron-impact and x-ray methods for measuring Compton profiles are compared.