Published February 2010 | Version v1
Journal article

Electrode activation in cesium-free negative ion sources

  • 1. Muons, Inc., Batavia, Illinois 60510 (United States)

Description

Features of emission electrode activation leading to enhancement of negative ion emission in cesium-free discharges are discussed. In some ion sources with cesium-free discharges, the emission of negative ions has been increased significantly by emission electrode activation using strong heating of the negative biased electrode by discharge plasma. A simple explanation of this enhancement is that it is due to an accumulation on the emission surface of the plasma electrode of impurities with low ionization potential that decreases in surface work function and increases the secondary emission of negative ions similar to ''Cesiation.'' The negative biasing of emission surface is important for accumulation and trapping the impurities on the emission surface. To effectively control the activation process it is important to directly detect the evolution of the work function and the impurity concentration during electrode activation with enhancement of negative ion emission.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
81
Journal Issue
2
Journal Page Range
p. 02A711-02A711.4
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
13. international conference on ion sources
Acronym
ICIS 2009
Dates
20-25 Sep 2009
Place
Gatlinburg, TN (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44013794
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANIONS; CESIUM; ELECTRIC DISCHARGES; ELECTRODES; ION SOURCES; IONIZATION POTENTIAL; PLASMA HEATING; PLASMA IMPURITIES; SECONDARY EMISSION; SURFACES; WORK FUNCTIONS
Descriptors DEC
ALKALI METALS; CHARGED PARTICLES; ELEMENTS; EMISSION; FUNCTIONS; HEATING; IMPURITIES; IONS; METALS

Optional Information

Notes
(c) 2010 American Institute of Physics