Published October 1, 2006
| Version v1
Journal article
Method for detailed evaluation of yield of Nb Josephson junctions
Creators
- 1. Superconductivity Research Laboratory, 34, Miyukigaoka, Tsukuba, Ibaraki 305-8501 (Japan)
Description
We have developed a method for evaluating Ic (critical current) spreading and yield of Nb Josephson junctions (JJ) through detailed current-voltage (I-V) measurements and applied the method to evaluation of 1000 serial arrays. Digitizing the stepwise I-V curve, we deduced the Ic value at each voltage step. This allowed us to easily detect irregularities such as junction shortages or Ics that were larger than those of the main distribution by reducing the resolution limit to 1 JJ. Using this method we can take into account very low frequency (<1%) failures in evaluating fabrication processes
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2006.05.073;
- PII
- S0921-4534(06)00508-9;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 445-448
- Journal Page Range
- p. 941-945
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 18. international symposium on superconductivity
- Acronym
- ISS 2005
- Dates
- 24-25 Oct 2005
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38066793
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL CURRENT; DISTRIBUTION; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; EVALUATION; FABRICATION; FAILURES; JOSEPHSON JUNCTIONS; NIOBIUM; RESOLUTION; TYPE-I SUPERCONDUCTORS
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTORS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.