Published June 1997
| Version v1
Journal article
X-ray, visible and electron spectroscopy with the NIST EBIT
Creators
- 1. National Institute of Standards and Technology, Atomic Physics Division (United States)
Description
An overview is given of recent activities at the NIST electron beam ion trap (EBIT) facility. The machine has been operational for almost three years. Important characteristics and demonstrated capabilities of our EBIT are presented. Selected results include experiments with trapped highly charged ions (X-ray and visible spectroscopy), and with extracted ions (ion-surface collision studies)
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 108
- Journal Issue
- 1-3
- Journal Page Range
- p. 59-72
- ISSN
- 0304-3843
- CODEN
- HYINDN
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39078265
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRON SPECTROSCOPY; ION BEAMS; MULTICHARGED IONS; TRAPS; VISIBLE SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; LEPTON BEAMS; PARTICLE BEAMS; SPECTRA; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 1997 Kluwer Academic Publishers