Instrumental analysis using Ge(Li) semiconductor detectors
Description
This is a manual published by Science and Technology Agency, Japan, in 1976. It comprises the following 10 chapters besides introduction, namely instruction for the principle and the apparatuses, selection and installation conditions for the equipments, adjustment and operating method, performance and testing method, peak data processing, counting efficiency and its determination, identification and quantitative analysis of nuclides, errors and measuring limits, recording example, and use of computers. Especially in chapter 5, important items are prescribed such as determination of full width at half maximum, linearity, energy resolution, efficiency, peak to Compton ratio, stability, dependence on count rate, background, and routine check. In chapter 8, adjustments to be performed prior to nuclide identification are prescribed, and identification and quantitative analysis must be carried out after such adjustments. The manual says that it is most practical to utilize the central computer together as seen from the points of cost and the capacity for data processing with a computer, and as for the softwares, the specific codes registered to that center are called and employed by using already practically applied program. (Wakatsuki, Y.)
Additional details
Additional titles
- Original title (Japanese)
- Ge(Li) handotai kenshutsuki o mochiita kiki bunsekiho
Publishing Information
- Publisher
- Japan Chemical Analysis Center.
- Imprint Place
- Tokyo, Japan
- Imprint Pagination
- 49 p.
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 10438223
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DATA PROCESSING; EFFICIENCY; ENERGY RESOLUTION; ERRORS; GAMMA SPECTROMETERS; GAMMA SPECTROSCOPY; LI-DRIFTED GE DETECTORS; MANUALS; PERFORMANCE TESTING; RADIOACTIVITY; RADIOISOTOPES
- Descriptors DEC
- DOCUMENT TYPES; GE SEMICONDUCTOR DETECTORS; ISOTOPES; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROMETERS; SPECTROSCOPY; TESTING
Optional Information
- Notes
- Hoshano sokuteiho ser. 7.