Published 1988
| Version v1
Book
Laser induced effects on the HgCdTe surface characterized by RBS and AES
- 1. Inst. de Optica, CSIC, Madrid (Spain)
- 2. Dept. de Fisica, LNETI, Sacavem (Portugal)
- 3. Inst. de Fisica de Materiales, CSIC, Madrid (Spain)
- 4. Centro de Fisica Nuclear da Universidade de Lisboa (Portugal)
Description
The goal of this work is to study the behavior of MCT as-grown surfaces under pulsed laser irradiation. Combined Rutherford backscattering (RBS) and Auger Electron Spectroscopy (AES) techniques were used to characterize the mercury losses as a function of the irradiation parameters. Channeled ions were used to study the crystal quality of the annealed surfaces. 4 refs
Additional details
Publishing Information
- Publisher
- Kluwer Academic.
- Imprint Place
- Dordrecht (Netherlands)
- ISBN
- 90-247-3703-6
- Imprint Title
- Nuclear physics applications on materials science
- Imprint Pagination
- 468 p.
- Journal Volume
- 144
- Series
- NATO ASI Series E.;Applied Sciences.
- Journal Page Range
- p. 403-404.
Conference
- Title
- NATO Advanced Science Institute on nuclear physics applications on materials science.
- Dates
- 6-18 Sep 1987.
- Place
- Viana do Castelo (Portugal).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19098498
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CADMIUM TELLURIDES; CATIONS; HELIUM IONS; ION CHANNELING; ION SCATTERING ANALYSIS; LASER RADIATION; MERCURY COMPOUNDS; PULSED IRRADIATION; QUANTITATIVE CHEMICAL ANALYSIS; RUTHERFORD SCATTERING; SPUTTERING; SURFACES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHANNELING; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELASTIC SCATTERING; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; IONS; IRRADIATION; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SCATTERING; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Notes
- Imprint:Includes index.