Published 1972 | Version v1
Book Metadata-only

A new technique for analyzing insulating materials by means of the ion microanalyzer

Creators

  • 1. Hitachi Ltd., Katsuta, Ibaraki (Japan). Naka Works

Description

no abstract available

Additional details

Publishing Information

Publisher
University of Tokyo Press.
Imprint Place
Tokyo, Japan
Imprint Title
Proceedings of the sixth international conference on x-ray optics and microanalysis
Imprint Pagination
p. 447-454.

Conference

Title
6. international conference on X-ray optics and microanalysis.
Dates
5 Sep 1971.
Place
Osaka, Japan.

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
5121616
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM INJECTION; DIELECTRIC MATERIALS; ELECTRON GUNS; ION BEAMS; ION DETECTION; ION EMISSION; SPECTRA; SPUTTERING
Descriptors DEC
BEAMS; CHARGED PARTICLE DETECTION; RADIATION DETECTION