Published May 2009 | Version v1
Journal article

Characterization of benzenethiolate self-assembled monolayer on Cu(1 0 0) by XPS and NEXAFS

  • 1. Dipartimento di Chimica, Universita di Roma 'La Sapienza', Piazzale Aldo Moro 2, I-00185 Roma (Italy)
  • 2. INFM-CNR Center on nanoStructures and bioSystems at Surfaces (S3), Via G. Campi 231/A, I-41100 Modena (Italy)
  • 3. Dipartimento di Fisica, CNISM, CNIS, Universita di Roma 'La Sapienza', Piazzale Aldo Moro 2, I-00185 Roma (Italy)
  • 4. Laboratorio TASC-INFM, Basovizza SS14 Km 163.5, I-34012 Trieste (Italy)

Description

The composition, electronic structure and molecular orientation of a self-assembled monolayer (SAM) of benzenethiolate on the Cu(1 0 0) surface have been investigated by means of X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS). An ordered benzenethiolate SAM with c(2 x 6) superstructure has been obtained by the reaction of diphenyldisulfide with the Cu(1 0 0) surface at room temperature. S 2p and C 1s XP spectra show S-Cu bond formation without significant thiolate decomposition. The strong dichroic signal of C K-edge NEXAFS upon varying polarization angle indicates upstanding of the adsorbed molecules with the benzene ring tilted by 20 deg. from the surface normal.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2009.03.004

Additional details

Identifiers

DOI
10.1016/j.elspec.2009.03.004;
PII
S0368-2048(09)00063-2;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
172
Journal Issue
1-3
Journal Page Range
p. 64-68
ISSN
0368-2048
CODEN
JESRAW

INIS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.