Published 1986 | Version v1
Book

Techniques of absolute low energy x-ray calibration

Creators

  • 1. Physics Div., Los Alamos National Lab., P.O. Box 1663, Mail Stop D410, Los Alamos, NM 87545

Description

Recent advances in pulsed plasma research, materials, science, and astrophysics have required many new diagnostic instruments for use in the low energy x-ray regime. The characterization of these instruments has provided a challenge to instrument designers and provided the momentum to improve x-ray sources and dosimetry techniques. In this paper, the present state-of-the-art in low energy x-ray characterization techniques is reviewed. A summary is given of low energy x-ray generator technology and dosimetry techniques including a discussion of thin window proportional counters and ionization chambers. A review is included of the widely used x-ray data bases and a sample of ultrasoft x-ray measuring techniques is discussed

Additional details

Publishing Information

Publisher
SPIE Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
Imprint Title
X-ray calibration: Techniques, sources and detectors
Journal Page Range
p. 94-101.

Conference

Title
30. SPIE technical symposium on optics and optoelectronic engineering.
Dates
17-22 Aug 1986.
Place
San Diego, CA (USA).