Published December 2007 | Version v1
Journal article

XPS characterization of YAlO3:Co single crystals

  • 1. Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-919 Warsaw (Poland)
  • 2. Institute of Physics, University of Silesia, ul. Uniwersytecka 4, 40-007 Katowice (Poland)

Description

YAlO3:Co (YAP:Co) single crystals have been obtained by the Czochralski method. The XPS spectra of YAP:Co annealed in reducing atmospheres: H2, vacuum and vacuum plus H2 are presented and discussed. As confirmed by magnetic measurements and the electron spectroscopy XPS the dopant concentration of Co is lower than a nominal one. The annealing processes removed colour centers due to relocation and some reduction of oxygen ions in the structure. The increased unit volume during the long annealing process may be caused by the change in some Co3+ ions into Co2+ ions. This explains the occurrence of the violet colour of the longtime annealed samples. The chemical shift analysis shows more ionic bond of Y-O than Al-O. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/crat.200711029

Additional details

Identifiers

Publishing Information

Journal Title
Crystal Research and Technology
Journal Volume
42
Journal Issue
12
Journal Page Range
p. 1341-1347
ISSN
0232-1300
CODEN
CRTEDF

Conference

Title
5. International conference on solid state crystals (ICSSC-5) and 8th Polish conference on crystal growth (PCCG-8)
Dates
20-24 May 2007
Place
Zakopane-Koscielisko (Poland)

Optional Information

Notes
With 8 figs., 5 tabs., 15 refs.. SICI: 0232-1300(200712)42:12<1341::AID-CRAT200711029>3.0.TX;2-T