X-ray tomographic and laminographic microscopy (XTM, XLM) using synchrotron radiation

Inner structures of composite materials, components or tissues have to be characterised with micrometer and even submicrometer resolution. It is often highly desirable that specimens stay unchanged after a first characterization to allow meaningful subsequent tests. This justifies major efforts for an ongoing improvement of nondestructive radiographical and tomographical methods for morphological characterization. Radiography and tomography as well as laminography can fulfill these requirements. X-ray sources and detectors have been improved. This applies for synchrotron-beamline systems as well as for tube based systems. A novel detector concept has been implemented in the XTM station at the SLS of the PSI in Villigen, Switzerland. This microtomography station at the SLS has started its operation in spring 2002. A selection of results related to industrial and scientific applications is presented in this contribution. Special emphasis will be given to first results of tomography with limited numbers of projections which is comparable to laminography. This method allows to characterise e.g. ribbons of tissue under load