SAXS Analysis of Embedded Pt Nanocrystals Irradiated with Swift Heavy Ions
Creators
- 1. Research School of Physical Sciences and Engineering, Australian National University (Australia)
- 2. Australian Synchrotron Research Program, Argone, IL (United States)
Description
Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.
Additional details
Identifiers
- DOI
- 10.1063/1.3086232;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1092
- Journal Issue
- 1
- Journal Page Range
- p. 45-47
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on synchrotron radiation in materials science
- Dates
- 20-23 Jul 2008
- Place
- Campinas (Brazil)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41011069
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DATA ANALYSIS; EVALUATION; HEAVY IONS; ION IMPLANTATION; IRRADIATION; NANOSTRUCTURES; PHOTON BEAMS; PHYSICAL RADIATION EFFECTS; SILICON OXIDES; SMALL ANGLE SCATTERING; SPHERICAL MODEL; THREE-DIMENSIONAL CALCULATIONS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; HEAT TREATMENTS; IONS; MATHEMATICAL MODELS; MICROSCOPY; NUCLEAR MODELS; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; SCATTERING; SILICON COMPOUNDS
Optional Information
- Notes
- (c) 2009 American Institute of Physics