Effect of silver ion-induced disorder on morphological, chemical and optical properties of poly (methyl methacrylate)
Creators
- 1. Department of Physics, Lahore College for Women University, Lahore 54000 (Pakistan)
- 2. Department of Physics, University of Engineering & Technology, Lahore 54000 (Pakistan)
- 3. Department of Nuclear Engineering and Radiological Sciences, Michigan Ion Beam Laboratory, University of Michigan, MI 48109-2104 (United States)
- 4. National Institute of Lasers & Optronics (NILOP), P.O. Nilore, Islamabad (Pakistan)
Description
Ion implantation is a versatile technique to tailor the surface properties of polymers in a controlled manner. In the present study, samples of poly (methyl methacrylate) (PMMA) have been implanted with 400 keV silver (Ag+) ion beam to various ion fluences ranging from 5 × 1013 to 5 × 1015 ions/cm2. The effect of Ag+ ion-induced disorder on morphological, chemical and optical properties of PMMA is analyzed using Atomic Force Microscope (AFM), Fourier transform infrared spectroscopy (FTIR) and ultraviolet–visible (UV–Vis) spectroscopy. Furthermore, the electrical conductivity of pristine and implanted PMMA is measured using four probe apparatus. The AFM images revealed the growth of nano-sized grainy structures and hillocks above the surface of implanted PMMA. The FTIR spectra confirmed the modifications in chemical structure of PMMA along with the formation of −C=C− carbon contents. The refractive index, extinction coefficient and photoconductivity of implanted PMMA have been found to increase as a function of ion fluence. Simultaneously, indirect optical band gap is reduced from 3.13 to 0.81 eV at a relatively high fluence (5 × 1015 ions/cm2). A linear correlation has been established between the band gap and Urbach energies. Moreover, the electrical conductivity of Ag+ implanted PMMA has increased from 2.14 × 10−10 (pristine) to 9.6 × 10−6 S/cm.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2016.09.024Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2016.09.024;
- PII
- S0168-583X(16)30407-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 387
- Journal Page Range
- p. 86-95
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48071382
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON; CHEMICAL PROPERTIES; FOURIER TRANSFORM SPECTROMETERS; IMAGES; INFRARED SPECTRA; ION BEAMS; ION IMPLANTATION; KEV RANGE 100-1000; METHACRYLIC ACID ESTERS; MORPHOLOGY; NANOSTRUCTURES; PHOTOCONDUCTIVITY; PMMA; REFRACTIVE INDEX; SILVER IONS; SURFACE PROPERTIES; SURFACES; ULTRAVIOLET RADIATION
- Descriptors DEC
- BEAMS; CARBOXYLIC ACID ESTERS; CHARGED PARTICLES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; ESTERS; IONS; KEV RANGE; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PHYSICAL PROPERTIES; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; SPECTRA; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.