Published May 1, 1995
| Version v1
Journal article
Refractive compensation in slab target geometries
Creators
- 1. Rutherford Appleton Laboratory, Chilton, Didcot, Oxon, OX11 0QX (United Kingdom)
- 2. Department of Physics, University of Hull, Hull, Y01 5DD (United Kingdom)
- 3. Department of Pure and Applied Physics, Queens University of Belfast, Northern Ireland, BT7 1NN (United Kingdom)
- 4. Institute of Laser Engineering, Osaka University, Suita, 565 (Japan)
Description
Results showing the enhancement effect on soft X-ray lasing emission intensity with target substrate curvature of up to 1 mrad per mm, which compensated for refraction due to electron density gradients present in the gain region of a Ne-like Ge expanding plasma are shown. Time integrated relative intensity and pointing data are presented for the Ne-like Ge 19.6, 23.6, and 28.6 nm 3p-3s transitions. A proposed simple illumination geometry for compensating for refraction due to lateral electron density gradients is also presented
Additional details
Identifiers
- DOI
- 10.1063/1.48006;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 332
- Journal Issue
- 1
- Journal Page Range
- p. 210-214
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- X-ray lasers 1994
- Acronym
- 4. international colloquium
- Dates
- 15-20 May 1994
- Place
- Williamsburg, VA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40032400
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON DENSITY; ENERGY-LEVEL TRANSITIONS; GAIN; GERMANIUM IONS; LASER TARGETS; LASER-PRODUCED PLASMA; MULTICHARGED IONS; PHOTON EMISSION; PLASMA; SLABS; SOFT X RADIATION; SUBSTRATES
- Descriptors DEC
- AMPLIFICATION; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; IONS; PLASMA; RADIATIONS; TARGETS; X RADIATION
Optional Information
- Notes
- (c) 1994 American Institute of Physics.