Published 1980
| Version v1
Book
Automatic image analysis for measuring nuclear tracks in plastics detectors
Description
In plastics nuclear track detectors traces of highly ionizing particles are formed by radiation damage of the material. These latent traces can be enlarged by etching with caustic solutions in such a way that they become observable by means of a microscope. Detection of such tracks in plastic foils and measuring of quantities that are proportional to the energy loss of the particle is possible by means of image analysis methods. The design of a computer-controlled microscope with autofocus is described. Image analysis and focusing are performed by means of software. The ways of application for this system are discussed by means of first experimental data. (orig.)
Abstract (German)
In Plastik-Kernspur-Detektoren entstehen Spuren von stark ionisierenden Teilchen durch einen Strahlenschaden des Materials. Diese latenten Spuren koennen durch Aetzen mit Laugen soweit vergroessert werden, dass sie mit dem Mikroskop beobachtbar sind. Das Auffinden derartiger Spuren in Plastikfolien und die Vermessung von Groessen, die dem Energieverlust des Teilchens proportional sind, ist mit Methoden der Bildanalyse moeglich. Es wird der Aufbau eines rechnergesteuerten Mikroskops mit Autofokus beschrieben. Die Bildanalyse und Fokussierung erfolgen mit Software. Die Einsatzmoeglichkeiten dieses Systems werden an ersten experimentellen Daten diskutiert. (orig.)Additional details
Additional titles
- Original title (German)
- Automatische Bildanalyse zur Vermessung von Kernspuren in Plastik-Detektoren
Publishing Information
- Publisher
- Springer.
- Imprint Place
- Berlin, Germany, F.R.
- Imprint Title
- Generation and analysis of images and structures
- Imprint Pagination
- 220 p.
- Journal Issue
- no. 29
- Series
- Informatik-Fachberichte.
- Journal Page Range
- p. 95-105.
Conference
- Title
- Generation and analyses of images and structures.
- Acronym
- 81. meeting of the DGaO (annual meeting 1980) and 3. symposium of the DAGM
- Dates
- 27 - 31 May 1980.
- Place
- Essen, Germany, F.R.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 12616642
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUTOMATION; DIGITAL SYSTEMS; ELECTRONIC EQUIPMENT; IMAGE PROCESSING; ON-LINE CONTROL SYSTEMS; OPTICAL MICROSCOPES; PARTICLE TRACKS; PDP COMPUTERS; PLASTIC SCINTILLATION DETECTOR
- Descriptors DEC
- COMPUTERS; CONTROL SYSTEMS; DEC COMPUTERS; MEASURING INSTRUMENTS; MICROSCOPES; ON-LINE SYSTEMS; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS
Optional Information
- Notes
- Imprint:Erzeugung und Analyse von Bildern und Strukturen.