Electrochemical synthesis of ZnO nanoflowers and nanosheets on porous Si as photoelectric materials
- 1. Department of Chemistry, Lanzhou University, Lanzhou 730000 (China)
Description
Well-aligned ZnO nanoflowers and nanosheets were synthesized on porous Si (PS) at different applied potentials by electrodeposition approach. The deposits were grown using the optimized program and were characterized by means of cyclic voltammetry (CV), amperometry I-t (I-t), open-circuit potentiometry. X-ray diffraction (XRD) analysis proved a strong preferential orientation (1 0 0) on PS. Scanning electronic microscopy (SEM) observation showed the deposits consist of nanoflowers with uniform grain size of about 100 nm in diameter and nanosheets, which may have potential applications in nanodevices and nanotechnologies. Thus, ZnO grown on PS can be used as photoelectric materials due to its larger photoelectric effect compared to Si wafer according to open-circuit potential (OCP) study. Optical band gap measurements were made on samples using UV-visible spectrophotometer thus giving a band gap of 3.35 eV.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.12.108Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.12.108;
- PII
- S0169-4332(10)01852-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 10
- Journal Page Range
- p. 4643-4649
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024372
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMPEROMETRY; DEPOSITS; ELECTROCHEMISTRY; ELECTRODEPOSITION; GRAIN SIZE; NANOSTRUCTURES; PHOTOELECTRIC EFFECT; POROUS MATERIALS; POTENTIOMETRY; SCANNING ELECTRON MICROSCOPY; SILICON; SPECTROPHOTOMETERS; SYNTHESIS; VOLTAMETRY; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMISTRY; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; LYSIS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SEMIMETALS; SIZE; SURFACE COATING; TITRATION; VOLUMETRIC ANALYSIS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.