Published March 1995 | Version v1
Journal article Metadata-only

Total reflection X-ray absorption and photoelectron spectroscopies

Creators

  • 1. Kyoto Univ. (Japan). Faculty of Engineering

Description

Our soft X-ray absorption spectroscopic experiments measured using grazing incidence X-ray beams are summarized. The implications of sample current and X-ray fluorescence yield are discussed. Total reflection X-ray photoelectron spectroscopy is also described. (author)

Additional details

Publishing Information

Journal Title
X-sen Bunseki No Shinpo
Journal Volume
26
Journal Issue
Special
Journal Page Range
p. 97-102.
ISSN
0911-7806
CODEN
XBNSDA

Conference

Title
5. Workshop on total reflection x-ray fluorescence spectroscopy and related spectroscopical methods.
Dates
17-19 Oct 1994.
Place
Tsukuba, Ibaraki (Japan).

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
27055275
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTRA; FLUORESCENCE; MEAN FREE PATH; PHOTOELECTRON SPECTROSCOPY; SOFT X RADIATION; SURFACES; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; SPECTRA; SPECTROSCOPY; X RADIATION; X-RAY EMISSION ANALYSIS