Enhancement of magnetization and dielectric properties of chromium-doped BiFeO3 with tunable morphologies
- 1. Institute for Superconducting and Electronic Materials (ISEM), University of Wollongong, Squires Way, Fairy Meadow, NSW, 2519 (Australia)
Description
Multiferroic BiFe1-xCrxO3 (x = 0.025, 0.05, 0.075, and 0.1) is prepared by the hydrothermal method. Samples are systematically characterized by X-ray diffraction, Rietveld refinement, SEM, dielectric and magnetic measurements. It is found that the lattice parameters, the morphology and the size of the obtained particles strongly depend on the Cr doping level. The lattice parameters a and c and the Fe-O (1) bond lengths decrease, while the Fe-O (2) bond lengths increase, as x values rise from 0.025 to 0.1. The particle morphology changes from spherical shape for pure BiFeO3 to octahedral shape for x = 0.1. The dielectric constant and the magnetization increase greatly with the increase of the Cr doping level. Both the M-T and the M-H results reveal that the Cr doping enhances the ferromagnetic state in the doped BiFeO3. The possible reasons for the enhanced magnetic and dielectric properties are discussed briefly.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2010.03.118Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2010.03.118;
- PII
- S0040-6090(10)00447-5;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 24
- Journal Page Range
- p. e5-e8
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Taiwan Association for Coatings and Thin Films Technology international thin films conference
- Acronym
- TACT 2009
- Dates
- 14-16 Dec 2009
- Place
- Taipei, Taiwan (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42067150
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH COMPOUNDS; BOND LENGTHS; CHROMIUM; CHROMIUM OXIDES; DIELECTRIC MATERIALS; DOPED MATERIALS; FERRITES; HYDROTHERMAL SYNTHESIS; LATTICE PARAMETERS; MAGNETIZATION; MORPHOLOGY; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHROMIUM COMPOUNDS; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; FERRIMAGNETIC MATERIALS; IRON COMPOUNDS; LENGTH; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SYNTHESIS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.