Published December 11, 2013 | Version v1
Journal article

The Belle II pixel detector: High precision with low material

Creators

Description

An upgrade of the existing Japanese flavor factory (KEKB in Tsukuba, Japan) is under construction, and foreseen for commissioning by the end of 2014. This new e+e− machine ("SuperKEKB") will deliver an instantaneous luminosity of 8×1035 cm-2 s−1, which is 40 times higher than the world record set by KEKB. In order to be able to fully exploit the increased number of events and provide high precision measurements of the decay vertex of the B meson systems in such a harsh environment, the Belle detector will be upgraded ("Belle II") and a new silicon vertex detector, based on the DEPFET technology, will be designed and constructed. The new pixel detector, close to the interaction point, will consist on two layers of DEPFET active pixel sensors. This technology combines the detection together with the in-pixel amplification by the integration, on every pixel, of a field effect transistor into a fully depleted silicon bulk. In Belle II, DEPFET sensors thinned down to 75μm with low power consumption and low intrinsic noise will be used

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2013.03.025

Additional details

Identifiers

DOI
10.1016/j.nima.2013.03.025;
PII
S0168-9002(13)00313-6;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
731
Journal Page Range
p. 31-35
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. international workshop on semiconductor pixel detectors for particles and imaging
Acronym
PIXEL 2012
Dates
3-7 Sep 2012
Place
Inawashiro, Fukushima (Japan)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.