Synthesis and characterization of anatase-TiO2 thin films
Creators
Description
A new and effective method for the preparation of nanocrystalline TiO2 (anatase) thin films is presented. This method is based on the use of peroxo-titanium complex as a single precursor. Post-annealing treatment is necessary to convert the deposited amorphous film into TiO2 (anatase) phase. The films obtained are uniform, compact and free of pinholes. A wide range of techniques are used for characterization, namely X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM), energy-dispersive X-ray analysis (EDAX) and UV-Vis-NIR spectrophotometer. Glass, indium-doped tin oxide (ITO) and quartz are used as substrates. TiO2 (anatase) phase with (1 0 1) preferred orientation is obtained for the films. Byproduct (collected powder) consists of the same crystal structure. The optical measurement reveals the indirect bandgap of 3.2 eV
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2004.05.142;
- PII
- S0169433204007986;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 239
- Journal Issue
- 2
- Journal Page Range
- p. 165-170
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38060447
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; DOPED MATERIALS; EV RANGE 01-10; GRAIN ORIENTATION; INDIUM OXIDES; QUARTZ; SPECTROPHOTOMETERS; SYNTHESIS; THIN FILMS; TIN OXIDES; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY RANGE; EV RANGE; FILMS; INDIUM COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MINERALS; ORIENTATION; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TIN COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.