Published December 1988
| Version v1
Journal article
Lateral charge transport from heavy-ion tracks in integrated circuit chips
- 1. Jet Propulsion Lab., California Institute of Technology, Pasadena, CA (USA)
- 2. Micron Technology, Inc., Boise, ID (USA)
Description
Experimental measurements on the lateral spreading of ion-track-induced charge in integrated circuit (IC) chips have been made using dynamic random access memory (DRAM) devices. The results of this work will aid in the design of ICs with reduced sensitivity to single-event upsets
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 35
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1644-1649
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- 25. annual conference on nuclear and space radiation effects.
- Dates
- 12-15 Jul 1988.
- Place
- Portland, OR (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20050953
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CHARGED-PARTICLE TRANSPORT; EXPERIMENTAL DATA; HEAVY IONS; INTEGRATED CIRCUITS; RADIATION EFFECTS; RADIOSENSITIVITY; SEMICONDUCTOR DEVICES; SPECIFICATIONS
- Descriptors DEC
- CHARGED PARTICLES; DATA; ELECTRONIC CIRCUITS; INFORMATION; IONS; NUMERICAL DATA; RADIATION TRANSPORT
Optional Information
- Secondary number(s)
- CONF-880730--.