Published October 1981 | Version v1
Journal article Metadata-only

Intensities of overlapping peaks in X-ray powder diffraction

Creators

  • 1. Karlova Univ., Prague (Czechoslovakia). Matematicky Ustav
  • 2. Bergakademie Freiberg (German Democratic Republic). Sektion Physik

Description

Separation of overlapping peaks in X-ray powder diffraction is investigated by means of fitting a modified Lorentzian function to experimental profiles of reflexions. Application of the new type of analytical function and simultaneous refinement of background level parameters are described and discussed with respect to the accurate determination of integrated intensities of reflexions. (author)

Additional details

Publishing Information

Journal Title
Cryst. Res. Technol.
Journal Volume
16
Journal Issue
10
Series
Cryst. Res. Technol.
Journal Page Range
1197-1204
ISSN
0023-4753

INIS

Country of Publication
Germany
Country of Input or Organization
German Democratic Republic
INIS RN
13670027
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ANALYTIC FUNCTIONS; INDIUM PHOSPHIDES; PEAKS; POWDERS; SPECTRA; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; FUNCTIONS; INDIUM COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; SCATTERING