Published June 26, 2000 | Version v1
Journal article

Michelson interferometer design for Linac Coherent Light Source (LCLS) applications in the 15-1.5 Aa wavelength range

  • 1. Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford, California 94305 (United States)

Description

In recent years the continuing development of linac-driven X-Ray Free Electron Laser (XRFEL) designs has significantly expanded the parameter space associated with 3rd and earlier-generation synchrotron radiation sources. In particular, in contrast to the >100 ps pulse durations typical of storage rings, temporal lengths extending down to the <100 fs regime will become available. For example, for the SLAC Linac Coherent Light Source (LCLS) a pulse duration of ∼200-300 fs with finer temporal features extending down to ∼1 fs is anticipated. The characterization of the phase space distributions of such pulses poses a significant challenge for instrumentation design both with regard to the brevity of the pulse structure as well as the X-ray (15-1.5 Aa) wavelength range of the FEL line. In this paper we assess a Michelson interferometer design aimed at characterizing the coherence length of the SLAC LCLS and discuss considerations related to its operation

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
521
Journal Issue
1
Journal Page Range
p. 463-470
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
11. US national conference on synchrotron radiation instrumentation
Acronym
SRI99
Dates
13-15 Oct 1999
Place
Stanford, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35041298
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COHERENT RADIATION; FREE ELECTRON LASERS; LIGHT SOURCES; LINEAR ACCELERATORS; MICHELSON INTERFEROMETER; WAVELENGTHS; X RADIATION
Descriptors DEC
ACCELERATORS; ELECTROMAGNETIC RADIATION; INTERFEROMETERS; IONIZING RADIATIONS; LASERS; MEASURING INSTRUMENTS; RADIATION SOURCES; RADIATIONS

Optional Information

Notes
(c) 2000 American Institute of Physics.