Michelson interferometer design for Linac Coherent Light Source (LCLS) applications in the 15-1.5 Aa wavelength range
Creators
- 1. Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford, California 94305 (United States)
Description
In recent years the continuing development of linac-driven X-Ray Free Electron Laser (XRFEL) designs has significantly expanded the parameter space associated with 3rd and earlier-generation synchrotron radiation sources. In particular, in contrast to the >100 ps pulse durations typical of storage rings, temporal lengths extending down to the <100 fs regime will become available. For example, for the SLAC Linac Coherent Light Source (LCLS) a pulse duration of ∼200-300 fs with finer temporal features extending down to ∼1 fs is anticipated. The characterization of the phase space distributions of such pulses poses a significant challenge for instrumentation design both with regard to the brevity of the pulse structure as well as the X-ray (15-1.5 Aa) wavelength range of the FEL line. In this paper we assess a Michelson interferometer design aimed at characterizing the coherence length of the SLAC LCLS and discuss considerations related to its operation
Additional details
Identifiers
- DOI
- 10.1063/1.1291832;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 521
- Journal Issue
- 1
- Journal Page Range
- p. 463-470
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 11. US national conference on synchrotron radiation instrumentation
- Acronym
- SRI99
- Dates
- 13-15 Oct 1999
- Place
- Stanford, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35041298
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COHERENT RADIATION; FREE ELECTRON LASERS; LIGHT SOURCES; LINEAR ACCELERATORS; MICHELSON INTERFEROMETER; WAVELENGTHS; X RADIATION
- Descriptors DEC
- ACCELERATORS; ELECTROMAGNETIC RADIATION; INTERFEROMETERS; IONIZING RADIATIONS; LASERS; MEASURING INSTRUMENTS; RADIATION SOURCES; RADIATIONS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.