Smooth growth, characterization and optical properties of Cu2SnS3 thin film via spray pyrolysis method

Simple, low cost spray pyrolysis technique is implemented herein to deposit thin film of Cu₂SnS₃ on a glass substrate for photovoltaic applications. Structural, physical, chemical and optical properties of the thin film were analyzed by XRD, SEM, AFM and UV-VIS spectroscopy. The XRD pattern indicated tetragonal phase of the deposited Cu₂SnS₃ thin film having major XRD peaks at 2θ of 28.54°, 33.07° and 47.47° corresponding to the (112), (200), and (220) planes. It was inferred from SEM and AFM micrographs that the surface was smooth without any pinholes or cracks. The root mean square value of film surface roughness was found to be 11.74 nm and film thickness was measured 200 nm. The AFM and SEM results indicated that the deposited thin film was densely packed and strongly adhered to the substrate. The energy band gap of the deposited Cu₂SnS₃ thin film was found to be 1.6eV via UV–Vis spectroscopy.