Published April 1, 2005
| Version v1
Journal article
Radiation hardness of the 1550 nm edge emitting laser for the optical links of the CDF silicon tracker
- 1. Institute of Physics, Academia Sinica, Nankang, Taipei 115, Taiwan (China)
Description
Radiation hardness is investigated for the laser transmitter of the optical links used for the CDF Run II silicon tracker. Beam tests were conducted with 30, 63, and 200 MeV protons with radiation doses up to 2 Mrad. The laser transmitter consists of an edge-emitting-type laser diode array and a BiCMOS driver chip. The laser light degradation is approximately linear to the radiation dose. The light degradation is about 10% at 200 krad. The radiation tolerance is expected to suffice for the CDF Run II operation
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.01.058;
- PII
- S0168-9002(05)00070-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 541
- Journal Issue
- 1-2
- Journal Page Range
- p. 208-212
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international symposium on development and application of semiconductor tracking detectors
- Acronym
- STD 5
- Dates
- 14-17 Jun 2004
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033564
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; DATA TRANSMISSION; FERMILAB COLLIDER DETECTOR; LASER RADIATION; LASERS; MEV RANGE 10-100; MEV RANGE 100-1000; OPERATION; PROTONS; RADIATION DOSES; RADIATION HARDENING; SILICON; TOLERANCE
- Descriptors DEC
- BARYONS; COMMUNICATIONS; DOSES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; HADRONS; HARDENING; MEASURING INSTRUMENTS; MEV RANGE; NUCLEONS; PHYSICAL RADIATION EFFECTS; RADIATION DETECTORS; RADIATION EFFECTS; RADIATIONS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.