Published 1995 | Version v1
Report

Simulation of the short pulse effects in the start-up from noise in high-gain FELS

  • 1. Chung-Ang Univ., Seoul (Korea, Republic of)
  • 2. Lawrence Berkeley Lab., CA (United States)

Description

The spatio-temporal evolution of high-gain free electron lasers from noise is investigated by 1-D simulation calculation. To understand the discrepancy between the experimental result and theoretical prediction of the self-amplified spontaneous emission (SASE), the strong slippage effect in the short pulse electron beam and the coherent bunched beam effect are considered. When the length over which the electron density varies significantly is comparable or smaller than the FEL wavelength, the initial noise level would be increased due to the enhanced coherence between electrons. With a proper computer modeling of the start-up from noise including the energy spread, the overall performance and characteristics of SASE are studied. This work will be helpful to increase the credibility of the simulation calculation to predict the SASE performance in all wave-length regions

Part of:
17th international free electron laser conference and 2nd international FEL users' workshop. Program and abstracts

Additional details

Publishing Information

Imprint Title
17th international free electron laser conference and 2nd international FEL users' workshop. Program and abstracts
Imprint Pagination
300 p.
Journal Page Range
p. Th3.63
Report number
BNL--61982-Absts

Conference

Title
17. international free electron laser conference; 2. international FEL users' workshop
Dates
21-25 Aug 1995
Place
New York, NY (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
39082332
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM BUNCHING; COMPUTERIZED SIMULATION; EMISSION; FREE ELECTRON LASERS; GAIN; NOISE; PULSE TECHNIQUES
Descriptors DEC
AMPLIFICATION; BEAM DYNAMICS; DYNAMICS; LASERS; MECHANICS; SIMULATION

Optional Information

Notes
This record replaces 27062516
Secondary number(s)
CONF-9508156--Absts