Simulation of the short pulse effects in the start-up from noise in high-gain FELS
Creators
- 1. Chung-Ang Univ., Seoul (Korea, Republic of)
- 2. Lawrence Berkeley Lab., CA (United States)
Description
The spatio-temporal evolution of high-gain free electron lasers from noise is investigated by 1-D simulation calculation. To understand the discrepancy between the experimental result and theoretical prediction of the self-amplified spontaneous emission (SASE), the strong slippage effect in the short pulse electron beam and the coherent bunched beam effect are considered. When the length over which the electron density varies significantly is comparable or smaller than the FEL wavelength, the initial noise level would be increased due to the enhanced coherence between electrons. With a proper computer modeling of the start-up from noise including the energy spread, the overall performance and characteristics of SASE are studied. This work will be helpful to increase the credibility of the simulation calculation to predict the SASE performance in all wave-length regions
Additional details
Publishing Information
- Imprint Title
- 17th international free electron laser conference and 2nd international FEL users' workshop. Program and abstracts
- Imprint Pagination
- 300 p.
- Journal Page Range
- p. Th3.63
- Report number
- BNL--61982-Absts
Conference
- Title
- 17. international free electron laser conference; 2. international FEL users' workshop
- Dates
- 21-25 Aug 1995
- Place
- New York, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 39082332
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM BUNCHING; COMPUTERIZED SIMULATION; EMISSION; FREE ELECTRON LASERS; GAIN; NOISE; PULSE TECHNIQUES
- Descriptors DEC
- AMPLIFICATION; BEAM DYNAMICS; DYNAMICS; LASERS; MECHANICS; SIMULATION
Optional Information
- Notes
- This record replaces 27062516
- Secondary number(s)
- CONF-9508156--Absts