Angular distribution of highly charged ions transmitted through metallic microcapillaries

The angular distribution of Xe6+ ions with an energy of 800 eV/q transmitted through Ni microcapillaries is studied by a classical trajectory simulation. The results for clean and contaminated by layers of insulating materials of the internal surface of capillary are presented. We show that the angular distributions can be used to identify different phases of hollow ion formation for clean metal surface. We also show that the angular distribution changes dramatically for the case of contaminated surface, i.e. when the image acceleration is depressed