Published June 18, 2008 | Version v1
Journal article

Electrophoretic deposition of ZnO nanoparticles, from micropatterns to substrate coverage

  • 1. Physics and Chemistry of Nanostructures, Ghent University, B-9000 Ghent (Belgium)
  • 2. Department of Information Technology, Ghent University, B-9000 Ghent (Belgium)
  • 3. Lumilab, Department of Solid State Sciences, Ghent University, B-9000 Ghent (Belgium)

Description

We report on an electrophoretic deposition (EPD) method that is suited for the preparation of both ZnO thin films and micropatterns. By applying small DC voltages between a Cu electrode and a conductive Si substrate, submersed in a suspension of ZnO quantum dots, we can cover entire substrates with ZnO layers of a tuneable thickness ranging from a few monolayers to 200 nm. The deposition occurs selectively at the cathode, which indicates that the ZnO particles have a positive charge. Atomic force microscopy was used to study the influence of the deposition voltage, time, and the quantum dot concentration on the final layer thickness. By using lithographically patterned Si substrates, the same technique enables the formation of ZnO micropatterns of variable thickness with dimensions down to 5 μm. This is done by depositing a ZnO layer on a Si substrate that is covered with a patterned, developed photoresist. After EPD, the resist is removed by submersing the substrate in the appropriate solvent without damaging the ZnO deposit. This illustrates the robustness of the layers obtained by EPD

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/24/245301

Additional details

Identifiers

DOI
10.1088/0957-4484/19/24/245301;
PII
S0957-4484(08)73238-0;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
24
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39111912
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DEPOSITION; DEPOSITS; ELECTROPHORESIS; LAYERS; PARTICLES; QUANTUM DOTS; SUBSTRATES; SUSPENSIONS; THICKNESS; THIN FILMS; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; DIMENSIONS; DISPERSIONS; FILMS; MICROSCOPY; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; ZINC COMPOUNDS