Published 2014
| Version v1
Journal article
An automated testing procedure for microstrip sensors for the CBM silicon tracking system
Description
The goal of the CBM experiment at FAIR is to explore the QCD phase diagram in the region of high net-baryon densities and moderate temperatures. The Silicon Tracking System (STS), the core tracking detector of the CBM experiment, is located close to the target and is used to reconstruct charged particle trajectories and its momenta in nucleus-nucleus collisions. The tracking stations will be mounted with ∝1200 double-sided silicon microstrip sensors which have to be tested before installation. For mass testing, automated quality assurance procedures are required to save both time and manpower. The performance of the developed program and the measurement results for different prototype sensors will be presented.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Frankfurt 2014 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 49(1)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2014 DPG Spring meeting with the divisions of physics education and physics of hadrons and nuclei. Industry- and book exhibition
- Original Conference Title
- DPG-Fruehjahrstagung 2014 der Fachverbaende Didaktik der Physik, Physik der Hadronen und Kerne. Industrie- und Buchausstellung
- Dates
- 17-21 Mar 2014
- Place
- Frankfurt am Main (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46106024
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUTOMATION; CHARGED PARTICLE DETECTION; PERFORMANCE; POSITION SENSITIVE DETECTORS; SI MICROSTRIP DETECTORS; TESTING
- Descriptors DEC
- DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Session: HK 50.8 Do 18:45; No further information available
- Collaborations
- CBM-Collaboration