Published 2014 | Version v1
Journal article

An automated testing procedure for microstrip sensors for the CBM silicon tracking system

  • 1. Goethe Universitaet Frankfurt (Germany)

Description

The goal of the CBM experiment at FAIR is to explore the QCD phase diagram in the region of high net-baryon densities and moderate temperatures. The Silicon Tracking System (STS), the core tracking detector of the CBM experiment, is located close to the target and is used to reconstruct charged particle trajectories and its momenta in nucleus-nucleus collisions. The tracking stations will be mounted with ∝1200 double-sided silicon microstrip sensors which have to be tested before installation. For mass testing, automated quality assurance procedures are required to save both time and manpower. The performance of the developed program and the measurement results for different prototype sensors will be presented.

Additional details

Publishing Information

Journal Title
Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue
Frankfurt 2014 issue
Series
Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 49(1)
Journal Page Range
[1 p.]
ISSN
0420-0195
CODEN
VDPEAZ

Conference

Title
2014 DPG Spring meeting with the divisions of physics education and physics of hadrons and nuclei. Industry- and book exhibition
Original Conference Title
DPG-Fruehjahrstagung 2014 der Fachverbaende Didaktik der Physik, Physik der Hadronen und Kerne. Industrie- und Buchausstellung
Dates
17-21 Mar 2014
Place
Frankfurt am Main (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
46106024
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AUTOMATION; CHARGED PARTICLE DETECTION; PERFORMANCE; POSITION SENSITIVE DETECTORS; SI MICROSTRIP DETECTORS; TESTING
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
Session: HK 50.8 Do 18:45; No further information available
Collaborations
CBM-Collaboration