Published July 2002 | Version v1
Journal article

The X-ray microscopy project at saga SLS

  • 1. National Institute of Advanced Industrial Science and Technology (AIST), Photonics Research Institute, Tsukuba (Japan)
  • 2. Ryukyus University, College of Education, Okinawa (Japan)
  • 3. Kansai Medical University, Dept. of Physics, Hirakata (Japan)
  • 4. Saga Synchrotron Light Source, Saga Prefectural Government, Saga (Japan)
  • 5. Kumamoto Technopolis Foundation, Kumamoto (Japan)
  • 6. Kyushu Univ., Institute for Fundamental Research of Organic Chemistry, Fukuoka (Japan)
  • 7. Kyushu Univ., Institute of Environmental Systems, Faculty of Engineering, Fukuoka (Japan)
  • 8. Kyushu Institute of Technology, Faculty of Engineering, Fukuoka (Japan)

Description

A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochromator (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ∼ 70 nm, the monochromaticity is ∼2000, and the photon flux is 109 ∼ 1010 photons/sec. (authors)

Additional details

Publishing Information

Journal Title
Journal de Physique. 4
Journal Volume
104
Journal Page Range
p. 63-66
ISSN
1155-4339
CODEN
JPICEI

Conference

Title
7. international conference on X-Ray microscopy - X-Ray microscopy 2002
Dates
28 Jul - 2 Aug 2002
Place
Grenoble (France)

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
34066029
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM OPTICS; OPTICAL MICROSCOPES; PERFORMANCE; SYNCHROTRON RADIATION SOURCES; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPES; RADIATION SOURCES; RADIATIONS

Optional Information

Notes
5 refs.