The X-ray microscopy project at saga SLS
Creators
- 1. National Institute of Advanced Industrial Science and Technology (AIST), Photonics Research Institute, Tsukuba (Japan)
- 2. Ryukyus University, College of Education, Okinawa (Japan)
- 3. Kansai Medical University, Dept. of Physics, Hirakata (Japan)
- 4. Saga Synchrotron Light Source, Saga Prefectural Government, Saga (Japan)
- 5. Kumamoto Technopolis Foundation, Kumamoto (Japan)
- 6. Kyushu Univ., Institute for Fundamental Research of Organic Chemistry, Fukuoka (Japan)
- 7. Kyushu Univ., Institute of Environmental Systems, Faculty of Engineering, Fukuoka (Japan)
- 8. Kyushu Institute of Technology, Faculty of Engineering, Fukuoka (Japan)
Description
A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochromator (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ∼ 70 nm, the monochromaticity is ∼2000, and the photon flux is 109 ∼ 1010 photons/sec. (authors)
Additional details
Publishing Information
- Journal Title
- Journal de Physique. 4
- Journal Volume
- 104
- Journal Page Range
- p. 63-66
- ISSN
- 1155-4339
- CODEN
- JPICEI
Conference
- Title
- 7. international conference on X-Ray microscopy - X-Ray microscopy 2002
- Dates
- 28 Jul - 2 Aug 2002
- Place
- Grenoble (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34066029
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; OPTICAL MICROSCOPES; PERFORMANCE; SYNCHROTRON RADIATION SOURCES; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPES; RADIATION SOURCES; RADIATIONS
Optional Information
- Notes
- 5 refs.