Published February 27, 2009
| Version v1
Journal article
Influence of oxygen deficiency in indium tin oxide on the performance of polymer light-emitting diodes
Creators
- 1. Chemical Engineering Department, National Tsing Hua University, Hsinchu 30013, Taiwan (China)
Description
We investigated effects of oxygen deficiency in the indium tin oxide (ITO) on the performance of poly(2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylene vinylene) (MEH-PPV)-based polymer light-emitting diodes, in which the ITO anode was deposited by radio frequency magnetron sputtering at different oxygen flow rates. We found that the degree of oxygen deficiency in the ITO films can affect the device performance significantly and is a source of current leakage. At the optimal oxygen flow rate, the leakage current of devices can be reduced and the balance between hole and electron fluxes can be promoted in the MEH-PPV layer to improve device efficiency
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.09.088Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.09.088;
- PII
- S0040-6090(08)01104-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 8
- Journal Page Range
- p. 2708-2711
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40061916
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FILMS; FLOW RATE; INDIUM OXIDES; LAYERS; LEAKAGE CURRENT; LIGHT EMITTING DIODES; MAGNETRONS; OXYGEN; PERFORMANCE; POLYMERS; SPUTTERING; TIN OXIDES
- Descriptors DEC
- CHALCOGENIDES; CURRENTS; ELECTRIC CURRENTS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; INDIUM COMPOUNDS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.