Nd:YAG laser irradiation of molecular-beam-epitaxy-deposited YBa2CU3O7-x superconducting thin films
- 1. Dept. of Electron. Sci., Delhi Univ. (India)
Description
Superconducting thin films of 123 compound were deposited on (100) single-crystalline SrTiO3 substrates using a molecular-beam-epitaxy system. Films were characterized by x-ray diffraction, scanning electron microscopy and compositional analysis using the EDAX technique. The films were irradiated by a 1.064 mu m wavelength Q-switched Nd:YAG laser of 20 ns pulse duration at 1.0 J cm-2/shot energy density. A systematic comparison of the film microstructure and compositional analysis before and after irradiation is presented here. Theoretical calculations based on a thermal model of laser heating to determine the surface-temperature rise of the film were performed using the finite-difference method. The film microstructure, showing fusion of grains, is attributed to the bolometric response of the whole film during 1.064 mu m laser irradiation. (author)
Availability note (English)
Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/Additional details
Identifiers
- URL
- http://www.iop.org/;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 8
- Journal Issue
- 2
- Journal Page Range
- p. 85-88
- ISSN
- 0953-2048
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Thailand
- INIS RN
- 34013431
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DATA; DIFFRACTION; ELECTRON MICROSCOPY; EPITAXY; FILMS; INFORMATION; MICROSCOPY; NUMERICAL DATA; SCATTERING