Published February 1972
| Version v1
Journal article
Direct evaluation of low-level counting techniques employing Ge(Li) detectors
Description
The low level counting capabilities and critical parameters of Ge(Li) gamma ray spectrometers are investigated using an expression for the spectrometer sensitivity limit. The significance of the counting parameters involved and the practical means by which they may be optimised have also been considered. A comparison method is used to evaluate the effectiveness and behaviour of several available counting techniques (e.g. coincidence and anti-coincidence methods).
Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 19
- Journal Issue
- 1
- Series
- IEEE (Inst. Electr. Electron. Eng.) Trans. Nucl. Sci.
- Journal Page Range
- 127-134
- ISSN
- 0018-9499
Conference
- Title
- Nuclear science symposium.
- Dates
- 3 Nov 1971.
- Place
- San Francisco, Calif.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 4041063
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COINCIDENCE SPECTROMETRY; COUNTING TECHNIQUES; GAMMA SPECTROMETERS; LI-DRIFTED GE DETECTORS; SENSITIVITY
- Descriptors DEC
- GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROMETERS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent