Published February 1972 | Version v1
Journal article

Direct evaluation of low-level counting techniques employing Ge(Li) detectors

Description

The low level counting capabilities and critical parameters of Ge(Li) gamma ray spectrometers are investigated using an expression for the spectrometer sensitivity limit. The significance of the counting parameters involved and the practical means by which they may be optimised have also been considered. A comparison method is used to evaluate the effectiveness and behaviour of several available counting techniques (e.g. coincidence and anti-coincidence methods).

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
19
Journal Issue
1
Series
IEEE (Inst. Electr. Electron. Eng.) Trans. Nucl. Sci.
Journal Page Range
127-134
ISSN
0018-9499

Conference

Title
Nuclear science symposium.
Dates
3 Nov 1971.
Place
San Francisco, Calif.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4041063
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COINCIDENCE SPECTROMETRY; COUNTING TECHNIQUES; GAMMA SPECTROMETERS; LI-DRIFTED GE DETECTORS; SENSITIVITY
Descriptors DEC
GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROMETERS

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent