Published 1997
| Version v1
Miscellaneous
An on-line measurement system for electrical devices in total dose radiation and its application in the research of total dose radiation and annealing effects of CMOS device
- 1. Academia Sinica, Urumqi (China). Xinjiang Inst. of Physics
Description
A computer-controlled on-line measurement system for electrical devices in total dose radiation has been set up. By applying it to the on line measurement and data acquisition of CMOS devices in total dose radiation and annealing, the response of CMOS device to total dose radiation and annealing has been investigated
Additional details
Publishing Information
- Imprint Title
- Proceedings of the 9th China symposium on computer application in modern science and technology
- Imprint Pagination
- 463 p.
- Journal Page Range
- p. 242-246
Conference
- Title
- 9. China symposium on computer application in modern science and technology
- Dates
- 10-15 Oct 1997
- Place
- Ningbo, Zhejiang (China)
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 29044146
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ANNEALING; BUILDUP; COMPUTERIZED CONTROL SYSTEMS; IONIZING RADIATIONS; MOS TRANSISTORS; ON-LINE MEASUREMENT SYSTEMS; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; SEMICONDUCTOR DEVICES
- Descriptors DEC
- CONTROL SYSTEMS; HEAT TREATMENTS; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS