Published 2001 | Version v1
Miscellaneous

Thermal properties of thin films measured by photothermal methods

  • 1. Institute of Physics, Silesian University of Technology, Gliwice (Poland)
  • 2. Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Warsaw (Poland)

Description

no abstract available

Part of:
Abstracts of 3. International Conference Novel Applications of Wide Bandgap Layers

Additional details

Publishing Information

Publisher
Oficyna Wydawnicza Politechniki Warszawskiej
ISBN
0-7803-7136-4
Imprint Title
Abstracts of 3. International Conference Novel Applications of Wide Bandgap Layers
Imprint Pagination
207 p.
Journal Page Range
p. 133-135

Conference

Title
Novel Applications of Wide Bandgap Layers
Acronym
3. International Conference
Dates
26-30 Jun 2001
Place
Zakopane (Poland)

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
33033794
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
ALUMINIUM NITRIDES; DIAMONDS; GEOMETRY; HEAT RESISTANT MATERIALS; ILLUMINANCE; INTERFACES; SILICON; SUBSTRATES; SURFACE COATING; THERMAL CONDUCTIVITY; THIN FILMS; WAVE PROPAGATION
Descriptors DEC
ALUMINIUM COMPOUNDS; CARBON; DEPOSITION; ELEMENTS; FILMS; MATERIALS; MATHEMATICS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHYSICAL PROPERTIES; PNICTIDES; SEMIMETALS; THERMODYNAMIC PROPERTIES

Optional Information

Notes
4 figs