Influence of the propagation-plane inclination angle on the fluorescent intensity: study of the emission of small-thickness samples and determination of the maximum emission angle
Creators
- 1. Bologna Univ. (Italy)
- 2. Universidade Nacional de Cordoba (Argentina). Facultad de Matematica
Description
A theoretical of the fluorescent intensity emitted by a small-thickness multicomponent specimen is carried out and a strong dependence on the inclination angle α of the propagation plane is found. The existence of one angular value αM at wich the total fluorescent emission achieves a maximum is demonstrated, and it is found that such an angle depends essentially on the sample thickness and composition. Calculating αM by means of the theoretical nodel, it is possible to select the optimal excitation detection configuration to reach the maximum fluorescent intensity compatible with the caracteristics of thickness and composition of the observed sample. Inversely, the thickness of a sample of known composition can be estimated by means of the experimental determination of the angle αM. However, it was found that this thickness measuring method has a very poor sensitivity. The theoretical results have been confirmed by Monte Carlo simulation
Availability note (English)
Available from the Library of the Comissao Nacional de Energia Nuclear, RJ, Brazil.Abstract (Portuguese)
Realizou-se um estudo teorico da intensidade fluorescente emitida por um especime multicomponente de pequena espessura e descobriu-se uma forte dependencia sobre o angulo de inclinacao α do plano de propagacao. A existencia de um valor angular αM na qual a emissao fluorescente total encontra um maximo e demonstrada, e encontra-se que tal angulo depende essencialmente da espessura da amostra e composicao. Calculando αM por meio de modelo teorico, e possivel selecionar a configuracao otima de detecao da excitacao para atingir a intensidade florescente maxima compativel com as caracteristicas da espessura e composicao da amostra observada. Inversamente, a espessura da amostra de composicao conhecida pode ser estimada por meio da determinacao experimental do angulo αM. Entretanto, descobriu-se que este metodo de medida de espessura e de sensibilidade muito pobre. Os resultados teoricos foram confirmados pelo metodo de Monte Carlo. (M.C.K.)Additional details
Publishing Information
- Imprint Title
- Proceedings of the 4. International Symposium on Radiation Physics
- Imprint Pagination
- 467 p.
- Journal Page Range
- p. 389-395.
Conference
- Title
- 4. International Symposium on Radiation Physics.
- Dates
- 3-7 Oct 1988.
- Place
- Sao Paulo, SP (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 21019962
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- FLUORESCENCE; INCIDENCE ANGLE; MEASURING METHODS; MONTE CARLO METHOD; QUANTITY RATIO; THICKNESS; X RADIATION
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; PHOTON EMISSION; RADIATIONS