Synthesis and characterization of epoxy composites filled with Pb, Bi or W compound for shielding of diagnostic x-rays
- 1. Universiti Sains Malaysia, School of Physics, Penang (Malaysia)
- 2. Curtin University, Department of Imaging and Applied Physics, GPO Box U1987, Perth, WA (Australia)
Description
Lead chloride, bismuth oxide and tungsten oxide filled epoxy composites with different weight fractions were fabricated to investigate their x-ray transmission characteristics in the x-ray diagnostic imaging energy range (40-127 kV) by using a conventional laboratory x-ray machine. Characterizations of the microstructure properties of the synthesized composites were performed using synchrotron radiation diffraction, backscattered electron imaging microscopy, three-point bend test and Rockwell hardness test. As expected, the x-ray transmission was decreased by the increment of the filler loading. Meanwhile, the flexural modulus and hardness of the composites were increased through an increase in filler loading. However, the flexural strength showed a marked decrease with the increment of filler loading (≥30 wt%). Some agglomerations were observed for the composites having ≥50 wt% of filler. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-012-7464-7Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 110
- Journal Issue
- 1
- Journal Page Range
- p. 137-144
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 44035445
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AGGLOMERATION; ATTENUATION; BACKSCATTERING; BISMUTH OXIDES; COMPOSITE MATERIALS; DEBYE-SCHERRER METHOD; DENSITY; ELECTRON MICROSCOPY; EPOXIDES; FLEXURAL STRENGTH; HARD X RADIATION; KEV RANGE 100-1000; KEV RANGE 10-100; LEAD CHLORIDES; MICROSTRUCTURE; PHOTON TRANSPORT; ROCKWELL HARDNESS; SHIELDING MATERIALS; TUNGSTEN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; CHLORIDES; CHLORINE COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; HALIDES; HALOGEN COMPOUNDS; IONIZING RADIATIONS; KEV RANGE; LEAD COMPOUNDS; LEAD HALIDES; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; NEUTRAL-PARTICLE TRANSPORT; ORGANIC COMPOUNDS; ORGANIC OXYGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION TRANSPORT; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS; X RADIATION