Published July 2007 | Version v1
Journal article

High-speed nano-processing with cluster ion beams

  • 1. Kyoto Univ., Dept. of Nuclear Engineering, Kyoto (Japan)
  • 2. Kyoto Univ., Quantum Science and Engineering Center, Kyoto (Japan)

Description

The gas cluster ion beam process has a high potential for material processing in nano-technology devices, such as photonic crystals, thin film transistors (TFTs) and micro-electromechanical systems (MEMS). In order to fabricate the devices, one needs to etch target materials with a high-speed, low-damage and ultra-smooth process. Extremely high rate sputtering was realized by high-energy cluster ion beam. We have been using this technique for poly-Si TFTs. There are many hillocks on poly-Si films formed by using a laser anneal technique, and they cause degradation of devices. When the laser crystallized poly-Si film was irradiated with cluster ion beam, the higher hillocks could be etched selectively and the surfaces of poly-Si films could be processed with low ion dose. High-speed nano-processing was realized by cluster ion beam. (author)

Additional details

Publishing Information

Journal Title
Annual Report of Quantum Science and Engineering Center
Journal Volume
9
Journal Page Range
p. 38-41
ISSN
1345-0700

Optional Information

Notes
15 refs., 5 figs.