High-speed nano-processing with cluster ion beams
Creators
- 1. Kyoto Univ., Dept. of Nuclear Engineering, Kyoto (Japan)
- 2. Kyoto Univ., Quantum Science and Engineering Center, Kyoto (Japan)
Description
The gas cluster ion beam process has a high potential for material processing in nano-technology devices, such as photonic crystals, thin film transistors (TFTs) and micro-electromechanical systems (MEMS). In order to fabricate the devices, one needs to etch target materials with a high-speed, low-damage and ultra-smooth process. Extremely high rate sputtering was realized by high-energy cluster ion beam. We have been using this technique for poly-Si TFTs. There are many hillocks on poly-Si films formed by using a laser anneal technique, and they cause degradation of devices. When the laser crystallized poly-Si film was irradiated with cluster ion beam, the higher hillocks could be etched selectively and the surfaces of poly-Si films could be processed with low ion dose. High-speed nano-processing was realized by cluster ion beam. (author)
Additional details
Publishing Information
- Journal Title
- Annual Report of Quantum Science and Engineering Center
- Journal Volume
- 9
- Journal Page Range
- p. 38-41
- ISSN
- 1345-0700
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39075889
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON; ATOMIC FORCE MICROSCOPY; CLUSTER BEAMS; ETCHING; FILMS; ION PAIRS; IRRADIATION; NANOSTRUCTURES; SILICON; SPUTTERING; SULFUR FLUORIDES; SURFACE TREATMENTS; TIME-OF-FLIGHT MASS SPECTROMETERS
- Descriptors DEC
- BEAMS; DYNAMIC MASS SPECTROMETERS; ELEMENTS; FLUIDS; FLUORIDES; FLUORINE COMPOUNDS; GASES; HALIDES; HALOGEN COMPOUNDS; MASS SPECTROMETERS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; RARE GASES; SEMIMETALS; SPECTROMETERS; SULFUR COMPOUNDS; SURFACE FINISHING; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Notes
- 15 refs., 5 figs.