Published June 5, 2006
| Version v1
Journal article
A single-chip two-wavelength switchable strained Si1-xGe x/Si-quantum-well LED
Creators
- 1. Graduate School of Arts and Sciences, University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902 (Japan)
- 2. PRESTO, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012 (Japan)
Description
Voltage-controlled emission wavelength switching (VCEWS) is demonstrated in a light-emitting diode (LED) containing a strained Si1-xGe x/Si double quantum well (DQW) in the active region. Impact ionization in a reverse-biased Si and SiGe allows the otherwise evasive bipolar VCEWS in LEDs containing type-II anti-electron QWs. A clear spectral dominance switch was observed upon changing the direction of the driving current where electroluminescence (EL) from the QW on the positive electrode side dominated. In transient EL, a 500 kHz bandwidth was obtained, indicating that the impact ionization controls the generation of the carriers
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.09.198;
- PII
- S0040-6090(05)02016-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 508
- Journal Issue
- 1-2
- Journal Page Range
- p. 410-413
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 4. international conference on silicon epitaxy and heterostructures
- Acronym
- ICSI-4
- Dates
- 23-26 May 2005
- Place
- Awaji Island, Hyogo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38004742
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTROLUMINESCENCE; GERMANIUM SILICIDES; IONIZATION; KHZ RANGE 100-1000; LIGHT EMITTING DIODES; QUANTUM WELLS; SWITCHES
- Descriptors DEC
- ELECTRICAL EQUIPMENT; EMISSION; EQUIPMENT; FREQUENCY RANGE; GERMANIUM COMPOUNDS; KHZ RANGE; LUMINESCENCE; NANOSTRUCTURES; PHOTON EMISSION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SILICIDES; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.