The Velociprobe: An ultrafast hard X-ray nanoprobe for high-resolution ptychographic imaging
Creators
- 1. Argonne National Laboratory (ANL), Lemont, IL (United States)
Description
Motivated by the advanced photon source upgrade, a new hard X-ray microscope called "Velociprobe" has been recently designed and built for fast ptychographic imaging with high spatial resolution. We are addressing the challenges of high-resolution and fast scanning with novel hardware designs, advanced motion controls, and new data acquisition strategies, including the use of high-bandwidth interferometric measurements. The use of granite, air-bearing-supported stages provides the necessary long travel ranges for coarse motion to accommodate real samples and variable energy operation while remaining highly stable during fine scanning. Scanning the low-mass zone plate enables high-speed and high-precision motion of the probe over the sample. With an advanced control algorithm implemented in a closed-loop feedback system, the setup achieves a position resolution (3σ) of 2 nm. The instrument performance is evaluated by 2D fly-scan ptychography with our developed data acquisition strategies. A spatial resolution of 8.8 nm has been demonstrated on a Au test sample with a detector continuous frame rate of 200 Hz. Using a higher flux X-ray source provided by double-multilayer monochromator, we achieve 10 nm resolution for an integrated circuit sample in an ultrafast scan with a detector's full continuous frame rate of 3000 Hz (0.33 ms per exposure), resulting in an outstanding imaging rate of 9 x 104 resolution elements per second
Availability note (English)
Available from https://www.osti.gov/servlets/purl/1565795; https://www.osti.gov/biblio/1565795; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo periodAdditional details
Identifiers
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 90
- Journal Issue
- 8
- Journal Page Range
- vp.
- ISSN
- 0034-6748
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 52123659
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ADVANCED PHOTON SOURCE; DATA ACQUISITION; HARD X RADIATION; IMAGE PROCESSING; INTEGRATED CIRCUITS; NANOSTRUCTURES; PERFORMANCE; SPATIAL RESOLUTION; X-RAY SOURCES
- Descriptors DEC
- DATA PROCESSING; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; IONIZING RADIATIONS; MICROELECTRONIC CIRCUITS; PROCESSING; RADIATION SOURCES; RADIATIONS; RESOLUTION; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Contract/Grant/Project number
- AC02-06CH11357; 2015-153-N0
- Funding organization
- USDOE Office of Science - SC (United States); U.S. Department of National Intelligence - Intelligence Advanced Research Projects Activity (IARPA) (United States)
- Secondary number(s)
- OSTIID--1565795