Studies on structural, optical, magnetic, and resistive switching properties of doped BiFe1-xCrxO3 thin films
Creators
- 1. University of Puerto Rico, San Juan, PR (United States). Dept. of Physics and Institute for Functional Nanomaterials
- 2. University of Puerto Rico, San Juan, PR (United States). Dept. of Physics, Dept. of Mathematics, and Institute for Functional Nanomaterials
Description
Here, we report the effect of multivalent Cr-ion doping on the structural, optical, magnetic, and resistive switching properties of BiFe1-xCrxO3 (BFCO) thin films (where, 0 ≤ x ≤ 0.15). BFCO thin films were deposited on Pt/TiO2/SiO2/Si (100) substrate using pulsed laser deposition technique. X-ray diffraction and micro-Raman analysis revealed the presence of a secondary phase in BFCO thin films, above 5% Cr doping concentrations. Enhanced magnetization was observed in BFCO films owing to ferromagnetic superexchange interaction between Fe and Cr-ions. X-ray photoelectron spectroscopy measurements revealed the multivalent states of Cr and Fe-ions, where suppression of oxygen vacancies due to Cr-ion doping in BFCO films was discussed based on the defect chemistry viewpoint. Moreover, current conduction and resistive switching properties were studied and the dominant switching mechanism was explained in the light of oxygen vacancies assisted filamentary conduction model.
Availability note (English)
Available from https://www.osti.gov/servlets/purl/1465124; https://www.osti.gov/biblio/1465124; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo periodAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 120
- Journal Issue
- 19
- Journal Page Range
- vp.
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 51038346
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHROMIUM IONS; DEPOSITS; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ENERGY BEAM DEPOSITION; IRON IONS; LASER RADIATION; MAGNETIZATION; PLATINUM; PULSED IRRADIATION; SILICON OXIDES; THIN FILMS; TITANIUM OXIDES; VACANCIES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; IONS; IRRADIATION; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PLATINUM METALS; POINT DEFECTS; RADIATIONS; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE COATING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- FG02-08ER46526; NSF-RII-0701525
- Funding organization
- USDOE (United States); National Science Foundation (NSF) (United States)
- Secondary number(s)
- OSTIID--1465124