High temperature oxidation resistance of fluorine-treated TiAl alloys: Chemical vs. ion beam fluorination techniques

The modification of the alloy surface by halogens significantly improves their oxidation behaviour at high temperature. It corresponds to the preferential reaction of the aluminium with the applied fluorine at the oxide/alloy interface and it promotes the growth of an adherent and stable alumina layer. Well-defined fluorine profiles beneath the surface of the material can be achieved by either fluorine beam line ion implantation (BLI2) or plasma immersion ion implantation (PI3). As an alternative to the implantation-based approach, chemical fluorination techniques such as gas-phase treatment and dipping in F-based solutions were also investigated. The fluorine depth-profiles were measured before and after oxidation at 900 oC using non destructive ion beam analyses: Proton Induced Gamma-ray Emission (PIGE), Rutherford Backscattering Spectroscopy (RBS) as well as Elastic Recoil Detection Analysis (ERDA). It enables to control and to optimise the fluorination conditions of technical TiAl alloys for an industrial application.