Published December 1985
| Version v1
Report
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Optimization of parameters affecting LSM performance as diffractors of soft x rays. Progress report, 1 April 1985-30 November 1985
Description
Progress has been made in designing multilayers optimal for the reflection of soft x rays. The effects of roughness and interfacial diffusion have been incorporated into the codes used for predicting reflectivity, and the roughness of several substrates and multilayers has been measured. Fabrication systems have been upgraded, and a robust multilayer composed of tantalum and carbon has been produced. Its reflectivity (to the fifth order of diffraction) has been measured at 1.5 A
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A03/MF A01 as DE87001927.
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Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Publishing Information
- Imprint Pagination
- 26 p.
- Report number
- DOE/DP/40199--2
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18049186
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Progress Report
- Descriptors DEI
- CARBON; FABRICATION; OPTICAL SYSTEMS; REFLECTION; SCATTERING; SOFT X RADIATION; TANTALUM; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NONMETALS; RADIATIONS; TRANSITION ELEMENTS; X RADIATION