Published November 13, 2006 | Version v1
Journal article

Ion behaviour in pulsed plasma regime by means of Time-resolved energy mass spectroscopy (TREMS) applied to an industrial radiofrequency Plasma Immersion Ion Implanter PULSION registered

  • 1. Equipe Plasma Surface, Laboratoire PIIM, UMR CNRS 6633, Universite de Provence, case 241, 13397 Marseille cedex 20 (France)
  • 2. ION BEAM SERVICES, ZI Peynier-Rousset, rue Gaston Imbert Prolongee, 13790 Peynier (France)

Description

In order to face the requirements for P+/N junctions requested for < 45 nm ITRS nodes, new doping techniques are studied. Among them Plasma Immersion Ion Implantation (PIII) has been largely studied. IBS has designed and developed its own PIII machine named PULSION registered . This machine is using a pulsed plasma. As other modem technological applications of low pressure plasma, PULSION registered needs a precise control over plasma parameters in order to optimise process characteristics. In order to improve pulsed plasma discharge devoted to PIII, a nitrogen pulsed plasma has been studied in the inductively coupled plasma (ICP) of PULSION registered and an argon pulsed plasma has been studied in the helicon discharge of the laboratory reactor of LPIIM (PHYSIS). Measurements of the Ion Energy Distribution Function (IEDF) with EQP300 (Hidden) have been performed in both pulsed plasma. This study has been done for different energies which allow to reconstruct the IEDF resolved in time (TREMS). By comparing these results, we found that the beginning of the plasma pulse, named ignition, exhaust at least three phases, or more. All these results allowed us to explain plasma dynamics during the pulse while observing transitions between capacitive and inductive coupling. This study leads in a better understanding of changes in discharge parameters as plasma potential, electron temperature, ion density

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
866
Journal Issue
1
Journal Page Range
p. 257-260
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
16. international conference on ion implantation technology
Acronym
IIT 2006
Dates
11-16 Jun 2006
Place
Marseille (France)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38056367
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON; ELECTRON TEMPERATURE; ENERGY SPECTRA; ION DENSITY; ION IMPLANTATION; MASS SPECTROSCOPY; NITROGEN; PLASMA; PLASMA DIAGNOSTICS; PLASMA POTENTIAL; PULSES; RADIOWAVE RADIATION; SEMICONDUCTOR MATERIALS; THERMONUCLEAR IGNITION; TIME RESOLUTION
Descriptors DEC
ELECTRIC POTENTIAL; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; MATERIALS; NONMETALS; RADIATIONS; RARE GASES; RESOLUTION; SPECTRA; SPECTROSCOPY; TIMING PROPERTIES

Optional Information

Notes
(c) 2006 American Institute of Physics